Fast-converging bit-flipping decoder for low-density parity-check codes

ABSTRACT

Disclosed are devices, systems and methods improving the convergence of a bit-flipping decoder in a non-volatile memory device. An example method includes receiving a noisy codeword, the codeword having been generated based on a parity check matrix of a low-density parity-check code and provided to a communication channel prior to reception by the bit-flipping decoder, and performing a single decoding iteration on the received noisy codeword, the single decoding iteration spanning a plurality of stages. In some embodiments, performing a single decoding iteration includes computing a metric corresponding to a single column of the parity check matrix, flipping at least one bit in the single column upon a determination that the metric exceeds a flipping threshold, computing, subsequent to the flipping, a syndrome as a product of the noisy codeword and the parity check matrix, and updating the flipping threshold upon a determination that the syndrome is not zero.

TECHNICAL FIELD

This patent document generally relates to non-volatile memory devices, and more specifically, to error correction in non-volatile memory devices.

BACKGROUND

Data integrity is an important feature for any data storage device and data transmission. Use of strong error-correction codes (ECCs) is recommended for various types of data storage devices including NAND flash memory devices.

Solid-state drives (SSDs) use multi-level NAND flash devices for persistent storage. However, the multi-level NAND flash devices can be inherently unreliable and generally need to use ECCs to allow dramatic increase in data reliability at the expense of extra storage space for ECC parity bits. There is a demand for ECCs that can provide data protection with improved convergence properties.

SUMMARY

Embodiments of the disclosed technology relate to methods, devices and systems for improving the convergence of a bit-flipping decoder for low-density parity-check (LDPC) codes. The methods and devices described in the present document advantageously, among other features and benefits, enable faster convergence in bit-flipping decoding algorithms, thereby providing higher throughput and lower power consumption.

In an example aspect, a method for improving convergence of a bit-flipping decoder includes receiving a noisy codeword, the codeword having been generated based on a parity check matrix of an LDPC code and provided to a communication channel prior to reception by the bit-flipping decoder; and performing a single decoding iteration on the received noisy codeword, the single decoding iteration spanning a plurality of stages, wherein, performing a single decoding iteration includes, for each of the plurality of stages: computing a metric corresponding to a single column of the parity check matrix, flipping at least one bit in the single column upon a determination that the metric exceeds a flipping threshold (T), computing, subsequent to the flipping, a syndrome (s) as a product of the noisy codeword and the parity check matrix, and updating the flipping threshold upon a determination that the syndrome is not zero, wherein updating the flipping threshold for a first stage of the plurality of stages is based on a first set of rules, and wherein updating the flipping threshold for a second stage subsequent to the first stage is based on a second set of rules different from the first set of rules.

In another example aspect, the above-described method may be implemented by a video encoder apparatus or a video decoder apparatus that comprises a processor.

In yet another example aspect, these methods may be embodied in the form of processor-executable instructions and stored on a computer-readable program medium.

The subject matter described in this patent document can be implemented in specific ways that provide one or more of the following features.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 illustrates an example of a memory system.

FIG. 2 is an illustration of an example non-volatile memory device.

FIG. 3 is an example diagram illustrating the cell voltage level distribution (V_(th)) of a non-volatile memory device.

FIG. 4 is another example diagram illustrating the cell voltage level distribution (V_(th)) of a non-volatile memory device.

FIG. 5 is an example diagram illustrating the cell voltage level distribution (V_(th)) of a non-volatile memory device before and after program interference.

FIG. 6 is an example diagram illustrating the cell voltage level distribution (V_(th)) of a non-volatile memory device as a function of the reference voltage.

FIG. 7 is a performance plot illustrating the fail-bit (FB) distribution and codeword failure rate (CFR) of a bit-flipping decoder in an exemplary NAND device.

FIG. 8 illustrates a flowchart of an example method for improving convergence of a bit-flipping decoder.

FIG. 9A illustrates a flowchart of another example method for improving convergence of a bit-flipping decoder.

FIG. 9B illustrates a flowchart of an yet another example method for improving convergence of a bit-flipping decoder.

DETAILED DESCRIPTION

Low-density parity-check (LDPC) codes are an important part of linear block error-correcting codes (ECCs), which have found widespread use in data storage systems. LDPC codes can be decoded by using two classes of decoding algorithms: soft-information message passing algorithms, e.g., min-sum or sum-product algorithms, and hard-decision algorithms such as bit-flipping algorithms. The soft-information decoding algorithms provide a very good decoding performance but require a large computation resources. They exhibit, therefore, very high complexity in hardware realization. On the contrary, the hardware implementations of hard-decision decoders were shown to have low complexity and reduced latency requirement because to the simple computation units and smaller connection networks, and have been developed to provide comparable error correction performance. In other systems, combinations of hard- and soft-decoding implementations are employed.

In most bit-flipping decoder architectures, the correction capability of a decoder is optimized so that is can correct more data and reduce the traffic going to the min-sum hard (MSH) decoder. However, based on data collected from thousands of NAND devices, this perspective may be inappropriate because correcting more data only marginally reduces the traffic to the MSH decoder. Thus, embodiments of the disclosed technology focus on, amongst other features and benefits, increasing the convergence of the bit-flipping decoder, thereby resulting in higher decoder throughput and lower power consumption requirements.

FIGS. 1-6 overview a non-volatile memory system in which embodiments of the disclosed technology may be implemented.

FIG. 1 is a block diagram of an example of a memory system 100 implemented based on some embodiments of the disclosed technology. The memory system 100 includes a memory module 110 that can be used to store information for use by other electronic devices or systems. The memory system 100 can be incorporated (e.g., located on a circuit board) in other electronic devices and systems. Alternatively, the memory system 100 can be implemented as an external storage device such as a USB flash drive and a solid-state drive (SSD).

The memory module 110 included in the memory system 100 can include memory areas (e.g., memory arrays) 102, 104, 106, and 108. Each of the memory areas 102, 104, 106, and 108 can be included in a single memory die or in multiple memory dice. The memory die can be included in an integrated circuit (IC) chip.

Each of the memory areas 102, 104, 106, and 108 includes a plurality of memory cells. Read, program, or erase operations can be performed on a memory unit basis. Thus, each memory unit can include a predetermined number of memory cells. The memory cells in a memory area 102, 104, 106, or 108 can be included in a single memory die or in multiple memory dice.

The memory cells in each of memory areas 102, 104, 106, and 108 can be arranged in rows and columns in the memory units. Each of the memory units can be a physical unit. For example, a group of a plurality of memory cells can form a memory unit. Each of the memory units can also be a logical unit. For example, the memory unit can be a bank, block, or page that can be identified by a unique address such as bank address, block address, and page basis address. During a read or write operation, the unique address associated with a particular memory unit can be used to access that particular memory unit. Based on the unique address, information can be written to or retrieved from one or more memory cells in that particular memory unit.

The memory cells in the memory areas 102, 104, 106, and 108 can include non-volatile memory cells. Examples of non-volatile memory cells include flash memory cells, phase change memory (PRAM) cells, magnetoresistive random-access memory (MRAM) cells, or other types of non-volatile memory cells. In an example implementation where the memory cells are configured as NAND flash memory cells, the read or write operation can be performed on a page basis. However, an erase operation in a NAND flash memory is performed on a block basis.

Each of the non-volatile memory cells can be configured as a single-level cell (SLC) or multiple-level memory cell. A single-level cell can store one bit of information per cell. A multiple-level memory cell can store more than one bit of information per cell. For example, each of the memory cells in the memory areas 102, 104, 106, and 108 can be configured as a multi-level cell (MLC) to store two bits of information per cell, a triple-level cell (TLC) to store three bits of information per cell, or a quad-level cells (QLC) to store four bits of information per cell. In another example, each of the memory cells in memory area 111 can be configured to store at least one bit of information (e.g., one bit of information or multiple bits of information), and each of the memory cells in memory area 112 can be configured to store more than one bit of information.

As shown in FIG. 1, the memory system 100 includes a controller module 120. The controller module 120 includes a memory interface 121 to communicate with the memory module 110, a host interface 126 with communicate with a host (not shown), a processor 124 to executes firmware-level code, and caches and memories 122 and 123 to temporarily or persistently store executable firmware/instructions and associated information. In some implementations, the controller unit 120 can include an error correction engine 125 to perform error correction operation on information stored in the memory module 110. Error correction engine 122 can be configured to detect/correct single bit error or multiple bit errors. In another implementation, error correction engine 125 can be located in the memory module 110.

The host can be a device or a system that includes one or more processors that operate to retrieve data from the memory system 100 or store or write data into the memory system 100. In some implementations, examples of the host can include a personal computer (PC), a portable digital device, a digital camera, a digital multimedia player, a television, and a wireless communication device.

In some implementations, the controller module 120 can also include a host interface 126 to communicate with the host. Host interface 126 can include components that comply with at least one of host interface specifications, including but not limited to, Serial Advanced Technology Attachment (SATA), Serial Attached Small Computer System Interface (SAS) specification, Peripheral Component Interconnect Express (PCIe).

FIG. 2 illustrates an example of a memory cell array implemented based on some embodiments of the disclosed technology.

In some implementations, the memory cell array can include NAND flash memory array that is partitioned into many blocks, and each block contains a certain number of pages. Each block includes a plurality of memory cell strings, and each memory cell string includes a plurality of memory cells.

In some implementations where the memory cell array is NAND flash memory array, read and write (program) operations are performed on a page basis, and erase operations are performed on a block basis. All the memory cells within the same block must be erased at the same time before performing a program operation on any page included in the block. In an implementation, NAND flash memories may use an even/odd bit-line structure. In another implementation, NAND flash memories may use an all-bit-line structure. In the even/odd bit-line structure, even and odd bit-lines are interleaved along each word-line and are alternatively accessed so that each pair of even and odd bit-lines can share peripheral circuits such as page buffers. In all-bit-line structure, all the bit-lines are accessed at the same time.

FIG. 3 illustrates an example of threshold voltage distribution curves in a multi-level cell device, wherein the number of cells for each program/erase state is plotted as a function of the threshold voltage. As illustrated therein, the threshold voltage distribution curves include the erase state (denoted “ER” and corresponding to “11”) with the lowest threshold voltage, and three program states (denoted “P1”, “P2” and “P3” corresponding to “01”, “00” and “10”, respectively) with read voltages in between the states (denoted by the dotted lines). In some embodiments, each of the threshold voltage distributions of program/erase states has a finite width because of differences in material properties across the memory array.

In writing more than one data bit in a memory cell, fine placement of the threshold voltage levels of memory cells is needed because of the reduced distance between adjacent distributions. This is achieved by using incremental step pulse program (ISPP), i.e., memory cells on the same word-line are repeatedly programmed using a program-and-verify approach with a stair case program voltage applied to word-lines. Each programmed state associates with a verify voltage that is used in verify operations and sets the target position of each threshold voltage distribution window.

Read errors can be caused by distorted or overlapped threshold voltage distribution. An ideal memory cell threshold voltage distribution can be significantly distorted or overlapped due to, e.g., program and erase (P/E) cycle, cell-to-cell interference, and data retention errors, which will be discussed in the following, and such read errors may be managed in most situations by using error correction codes (ECC).

FIG. 4 illustrates an example of ideal threshold voltage distribution curves 410 and an example of distorted threshold voltage distribution curves 420. The vertical axis indicates the number of memory cells that has a particular threshold voltage represented on the horizontal axis.

For n-bit multi-level cell NAND flash memory, the threshold voltage of each cell can be programmed to 2^(n) possible values. In an ideal multi-level cell NAND flash memory, each value corresponds to a non-overlapping threshold voltage window.

Flash memory P/E cycling causes damage to a tunnel oxide of floating gate of a charge trapping layer of cell transistors, which results in threshold voltage shift and thus gradually degrades memory device noise margin. As P/E cycles increase, the margin between neighboring distributions of different programmed states decreases and eventually the distributions start overlapping. The data bit stored in a memory cell with a threshold voltage programmed in the overlapping range of the neighboring distributions may be misjudged as a value other than the original targeted value.

FIG. 5 illustrates an example of a cell-to-cell interference in NAND flash memory. The cell-to-cell interference can also cause threshold voltages of flash cells to be distorted. The threshold voltage shift of one memory cell transistor can influence the threshold voltage of its adjacent memory cell transistor through parasitic capacitance-coupling effect between the interfering cell and the victim cell. The amount of the cell-to-cell interference may be affected by NAND flash memory bit-line structure. In the even/odd bit-line structure, memory cells on one word-line are alternatively connected to even and odd bit-lines and even cells are programmed ahead of odd cells in the same word-line. Therefore, even cells and odd cells experience different amount of cell-to-cell interference. Cells in all-bit-line structure suffer less cell-to-cell inference than even cells in the even/odd bit-line structure, and the all-bit-line structure can effectively support high-speed current sensing to improve the memory read and verify speed.

The dotted lines in FIG. 5 denote the nominal distributions of P/E states (before program interference) of the cells under consideration, and the “neighbor state value” denotes the value that the neighboring state has been programmed to. As illustrated in FIG. 5, if the neighboring state is programmed to P1, the threshold voltage distributions of the cells under consideration shift by a specific amount. However, if the neighboring state is programmed to P2, which has a higher threshold voltage than P1, that results in a greater shift compared to the neighboring state being P1. Similarly, the shift in the threshold voltage distributions is greatest when the neighboring state is programmed to P3.

FIG. 6 illustrates an example of a retention error in NAND flash memory by comparing normal threshold-voltage distribution and shifted threshold-voltage distribution. The data stored in NAND flash memories tend to get corrupted over time and this is known as a data retention error. Retention errors are caused by loss of charge stored in the floating gate or charge trap layer of the cell transistor. Due to wear of the floating gate or charge trap layer, memory cells with more program erase cycles are more likely to experience retention errors. In the example of FIG. 6, comparing the top row of voltage distributions (before corruption) and the bottom row of distributions (contaminated by retention error) reveals a shift to the left.

FIG. 7 is a performance plot illustrating the fail-bit (FB) distribution and codeword failure rate (CFR) of a bit-flipping decoder in an exemplary NAND device (e.g., the NAND device described in the context of FIGS. 1-6). FIG. 7 illustrates NAND fail-bit (FB) count distributions on the left-hand y-axis for different values of erase/write cycles (e.g., EWCYC=3000, 5000 and 7000), and the codeword failure rate for a bit-flipping decoder (denoted “BF”) and an improved bit-flipping decoder (denoted “iBF”) on the right-hand y-axis. In an example, the iBF decoder a version of the BF decoder in which the energy function (or flipping energy or indicator) is based on channel information; e.g., whether the current hard decision is different from a hard decision corresponding to the received bit or not.

As illustrated in FIG. 7, orders of magnitude of reduction in the CFR of a bit-flipping decoder only translates to a tiny traffic reduction to the min-sum hard (MSH) decoder. This is because a majority of the traffic, even at end-of-life (EOL) conditions, have low FB counts. Only a small percentage of the traffic will have a FB count that is close to the waterfall point of the bit-flipping decoder's CFR curve. Thus, embodiments of the disclosed technology focus on, amongst other features and benefits, optimizing or improving the operations of the bit-flipping decoder to handle the majority of traffic, which is characterized by a low FB count. As discussed earlier, this optimization results in an increased decoder throughput and lower power consumption requirements.

An exemplary operation of the bit-flipping decoder assumes that x=[x₀, x₁, . . . , x_(N−1)] is a bit vector and H=[h_(ij)] is an M×N low-density parity-check matrix with a binary value h_(ij) at row i and column j, and with each row of H providing a parity check for x. If x is a codeword of H, then xH^(T)=0. It is further assumed that x is transmitted over a noisy channel and that the output of the channel is y=[y₀, y₁, . . . , y_(N−1)], which is processed by the receiver. The parity-check matrix of an LDPC code can be represented by a bipartite graph called a Tanner graph that is composed of two groups of nodes: checks nodes and variable nodes.

In an example, the receiver computes the syndrome of y as a binary vector calculated as s=[s₀, s₁, . . . , s_(N−1)]=yH^(T), with the weight of s (denoted ∥s∥ and equivalent to the number of “1” entries in s) representing the number of unsatisfied check nodes. Furthermore, the number of unsatisfied check nodes connected with variable node j is denoted ∥s_(j)∥.

An example algorithm for improving convergence of a bit-flipping decoder, according to embodiments of the disclosed technology, assumes E(i) is the flipping energy (or indicator) of the i-th column, T is the flipping threshold, s is the syndrome, t is the iteration index (or number) such that (0≤t≤t_(max)), d_(j) ^((t)) denotes the decision of variable node j of the t-th iteration, and

d ^((t)) ┌d ₀ ^((t)) , d ₁ ^((t)) , . . . , d _(N−1) ^((t)) ┐·s ^((t)) =┌d ₀ ^((t)) , d ₁ ^((t)) , . . . , d _(N−1) ^((t)) ┐H ^(T).

Lastly, if it is assumed that d⁽⁻¹⁾=┌d₀ ⁽⁻¹⁾, d₁ ⁽⁻¹⁾, . . . , d_(N−1) ⁽⁻¹⁾┐=y, then s⁽⁻¹⁾=yH^(T).

In some embodiments, the iterative decoding algorithm is described as follows:

-   -   Operation 0: Set t=0, calculate s⁽⁻¹⁾ and go to Operation 1;     -   Operation 1: If max iteration exceeded, stop decoding. Else, go         to Operation 2;     -   Operation 2: If s=0, stop decoding. Otherwise, go to Operation         3;     -   Operation 3: For all of the variable nodes, perform the         following operations:         -   update the flipping indicator (or energy), E(j);         -   update the flipping threshold, T;         -   flip the j-th bit if E(j)>T;         -   compute and update s; and         -   go to Operation 1.

In some embodiments, the flipping indicator E(j) is updated as follows:

-   -   if d_(j) ^((t))=y_(j), then E(j)=∥s_(j)∥; otherwise,         E(j)=∥s_(j)∥+α.

Herein, α can be any positive value. For example, if α is set to 1, E(j)=∥s_(j)∥+1 when d_(h) ^((t))≠y_(j).

In some embodiments, the adaptive flipping threshold T is generated based on the iteration number, the number of unsatisfied check nodes of the previous iteration, and/or the number of variable nodes flipped in the previous iteration. In an example finite state machine (FSM) that can be used to adaptively update the flipping threshold, the following computations are performed:

-   -   if (t==0) and (∥s∥<β₁), then T=δ₁;     -   else if (t==0), then T=δ₁−1;     -   else if (t==1), then T=δ₁;     -   else if (p==0), then T=T−1;     -   else if (t>ε) and (∥s∥<β₂), then T=δ₂;     -   else if (∥s∥<β₃) and (p>θ₁) and (T+1)<δ₃, then T=T+1;     -   else if (∥s∥<β₃) and (p>θ₁), then T=δ₃;     -   else if (p≤θ₂) and (∥s∥>β₃), then T=max(δ₄, T−1);     -   else T=T.

Herein, β₁, β₂, β₃, β₄, β₅, θ₁, θ₂ and ε are parameters that are predetermined or that can be configured adaptively. In an example, β₁=50, β₂=20, β₃=9999, δ₁=5, β₂=4, δ₃=5, δ₃=3, δ₁=10, δ₂=10, and ε=10. In another example, these parameters may be optimized to maximize the throughput of the bit-flipping decoder.

In some embodiments, the error correction mechanism flips a single bit. In other embodiments, errors are corrected by flipping multiple bits.

FIG. 8 illustrates a flowchart of an example method for improving the convergence of a bit-flipping decoder. Maintaining the notation of the previously described example, the method 800 begins with initializing the decoder 805 (e.g., by running a dummy iteration) to generate the bit-flipping threshold T. Similar to Operation 3 in the above description, the flipping energy for the i-th column E(i) is computed 810, and compared to the bit-flipping threshold 815, which results in either a bit being flipped (Δ=1 if E(j)≥T) or a bit not being flipped (Δ=0 if E(j)<T).

The conditional bit-flipping is followed by recomputing the syndrome (s_new) and the checksum value (C) 820. If the checksum value is equal to zero (operation 825), then the bit-flipping decoder is stopped since the received codeword has been correctly decoded. If the checksum is not equal to zero, then the syndrome and checksum values are updated 830, and the threshold is updated 835. In an example, the threshold is updated based on the iteration number, the number of unsatisfied check nodes of the previous iteration, and/or the number of variable nodes flipped in the previous iteration, as described above.

The column index (i) is iterated, whether the last column was processed is determined 840. If all columns have been processed, then the iteration index is incremented and the next iteration is initialized 850. If the iteration index has exceeded the maximum number of iterations 845, then the bit-flipping decoder is stopped. Otherwise, control returns to operation 810 where the flipping energy for the (i+1)-th column E(i+1) is computed.

FIG. 9A illustrates a flowchart of an example method 900 for improving convergence of a bit-flipping decoder. The method 900 includes, at operation 910, receiving a noisy codeword, the codeword having been generated based on a parity check matrix of a low-density parity-check (LDPC) code and provided to a communication channel prior to reception by the bit-flipping decoder.

The method 900 includes, at operation 920, performing a single decoding iteration on the received noisy codeword, the single decoding iteration spanning a plurality of stages.

FIG. 9B illustrates a flowchart related to operation 920 of FIG. 9A. In some embodiments, performing the single decoding iteration includes, for each of the plurality of stages, computing a metric corresponding to a single column of the parity check matrix (922).

Operation 920 includes flipping at least one bit in the single column upon a determination that the metric exceeds a flipping threshold (924).

Operation 920 includes computing, subsequent to the flipping, a syndrome as a product of the noisy codeword and the parity check matrix (926).

Operation 920 includes updating the flipping threshold upon a determination that the syndrome is not zero, the flipping threshold for a first stage of the plurality of stages being updated based on a first set of rules, and updating the flipping threshold for a second stage subsequent to the first stage being based on a second set of rules different from the first set of rules (928).

In some embodiments, updating the flipping threshold is based on an index of the decoding iteration, a number of non-zero values in the syndrome, or a number of bits flipped in a column of the parity check matrix in a previous decoding iteration.

In some embodiments, a set of rules comprises a finite state machine (FSM).

In some embodiments, the FSM is configured to maximize a throughput of the bit-flipping decoder. FIG. 7 illustrated that orders of magnitude of reduction in the CFR of a bit-flipping decoder only translates to a tiny traffic reduction to the min-sum hard (MSH) decoder. Thus, embodiments of the disclosed technology focus on, amongst other features and benefits, improving the convergence of the bit-flipping decoder instead of simply reducing the traffic to the MSH decoder.

In some embodiments, flipping the at least one bit comprises flipping multiple bits in the single column. In an example, flipping multiple bits can improve the convergence speed.

In some embodiments, each stage of the plurality of stages corresponds to a predetermined number of clock cycles.

Typically a single bit-flipping decoder iteration operates over several clock cycles (e.g., number of clock cycles, K>>1), and the bit-flipping threshold (amongst other parameters) is only updated after an iteration is completed, i.e., the decoder parameters are updated for the next multi clock cycle iteration if the iteration index has not exceeded the maximum number of iterations. Embodiments of the disclosed technology update the bit-flipping threshold after a predetermined number of clock cycles (e.g., K=1, 2, 5 and so on), which is configured to occur in the middle of an iteration.

In some embodiments, an index of the single decoding iteration is less than a maximum number of decoding iterations.

The use of LDPC codes in data storage systems are typically configured for operation at a signal-to-noise ratio (SNR) that is higher than the typical wireless channel. Consequently, the number of errors encountered in the received (or read) codeword are fewer than in the case of a wireless channel. Thus, embodiments of the disclosed technology are configured to perform LDPC bit-flipping decoding operations at time increments smaller than a complete iteration (e.g., per clock cycle or per a predetermined number of clock cycles). This ensures that if a codeword only has 1-2 bit errors, and they get corrected after processing the first few columns, then the remainder of the iteration is not be completed as in a conventional bit-flipping decoder because the checksum and syndrome is checked after each bit-flipping operation. This advantageously increases the decoder throughput and reduces power consumption.

The methods and algorithms described above (including methods 800 and 900) can be configured to update the syndrome at every clock cycle, which is applied to the flipping indicator (or energy) calculation after a certain number of cycles of processing delay. The methods can be further configured to update the flipping threshold at every single clock cycle (or after every predetermined number of clock cycles).

In some embodiments, different finite state machines (FSMs) can be used to update the threshold at different clock cycles. In an example, FSM₁ is used to update the threshold at a first clock cycle, and FSM₂ is used to update the threshold at a second clock cycle and so on. In another example, FSM₁ is used initially, FSM₂ is used after a first predetermined number of clock cycles, and FSM₃ is used for the last set of clock cycles. In yet another example, and if a quasi-cyclic LDPC (QC-LDPC) code is being used, the FSM is configured based on properties of the circulant weights of the parity check matrix. The FSMs can be optimized to maximize the throughput of the bit-flipping decoder.

Implementations of the subject matter and the functional operations described in this patent document can be implemented in various systems, digital electronic circuitry, or in computer software, firmware, or hardware, including the structures disclosed in this specification and their structural equivalents, or in combinations of one or more of them. Implementations of the subject matter described in this specification can be implemented as one or more computer program products, i.e., one or more modules of computer program instructions encoded on a tangible and non-transitory computer readable medium for execution by, or to control the operation of, data processing apparatus. The computer readable medium can be a machine-readable storage device, a machine-readable storage substrate, a memory device, a composition of matter effecting a machine-readable propagated signal, or a combination of one or more of them. The term “data processing unit” or “data processing apparatus” encompasses all apparatus, devices, and machines for processing data, including by way of example a programmable processor, a computer, or multiple processors or computers. The apparatus can include, in addition to hardware, code that creates an execution environment for the computer program in question, e.g., code that constitutes processor firmware, a protocol stack, a database management system, an operating system, or a combination of one or more of them.

A computer program (also known as a program, software, software application, script, or code) can be written in any form of programming language, including compiled or interpreted languages, and it can be deployed in any form, including as a stand-alone program or as a module, component, subroutine, or other unit suitable for use in a computing environment. A computer program does not necessarily correspond to a file in a file system. A program can be stored in a portion of a file that holds other programs or data (e.g., one or more scripts stored in a markup language document), in a single file dedicated to the program in question, or in multiple coordinated files (e.g., files that store one or more modules, sub programs, or portions of code). A computer program can be deployed to be executed on one computer or on multiple computers that are located at one site or distributed across multiple sites and interconnected by a communication network.

The processes and logic flows described in this specification can be performed by one or more programmable processors executing one or more computer programs to perform functions by operating on input data and generating output. The processes and logic flows can also be performed by, and apparatus can also be implemented as, special purpose logic circuitry, e.g., FPGA (field programmable gate array) or ASIC (application specific integrated circuit).

Processors suitable for the execution of a computer program include, by way of example, both general and special purpose microprocessors, and any one or more processors of any kind of digital computer. Generally, a processor will receive instructions and data from a read only memory or a random access memory or both. The essential elements of a computer are a processor for performing instructions and one or more memory devices for storing instructions and data. Generally, a computer will also include, or be operatively coupled to receive data from or transfer data to, or both, one or more mass storage devices for storing data, e.g., magnetic, magneto optical disks, or optical disks. However, a computer need not have such devices. Computer readable media suitable for storing computer program instructions and data include all forms of nonvolatile memory, media and memory devices, including by way of example semiconductor memory devices, e.g., EPROM, EEPROM, and flash memory devices. The processor and the memory can be supplemented by, or incorporated in, special purpose logic circuitry.

While this patent document contains many specifics, these should not be construed as limitations on the scope of any invention or of what may be claimed, but rather as descriptions of features that may be specific to particular embodiments of particular inventions. Certain features that are described in this patent document in the context of separate embodiments can also be implemented in combination in a single embodiment. Conversely, various features that are described in the context of a single embodiment can also be implemented in multiple embodiments separately or in any suitable subcombination. Moreover, although features may be described above as acting in certain combinations and even initially claimed as such, one or more features from a claimed combination can in some cases be excised from the combination, and the claimed combination may be directed to a subcombination or variation of a subcombination.

Similarly, while operations are depicted in the drawings in a particular order, this should not be understood as requiring that such operations be performed in the particular order shown or in sequential order, or that all illustrated operations be performed, to achieve desirable results. Moreover, the separation of various system components in the embodiments described in this patent document should not be understood as requiring such separation in all embodiments.

Only a few implementations and examples are described and other implementations, enhancements and variations can be made based on what is described and illustrated in this patent document. 

1. A method of improving convergence of a bit-flipping decoder in a non-volatile memory device, comprising: receiving a noisy codeword, the codeword having been generated based on a parity check matrix of a low-density parity-check (LDPC) code and provided to a communication channel prior to reception by the bit-flipping decoder; and performing a single decoding iteration on the received noisy codeword, the single decoding iteration spanning a plurality of stages, wherein, performing the single decoding iteration includes, for each of the plurality of stages: computing a metric corresponding to a single column of the parity check matrix, flipping at least one bit in the single column upon a determination that the metric exceeds a flipping threshold, computing, subsequent to the flipping, a syndrome as a product of the noisy codeword and the parity check matrix, and updating the flipping threshold upon a determination that the syndrome is not zero, wherein updating the flipping threshold for a first stage of the plurality of stages is based on a first set of rules, and wherein updating the flipping threshold for a second stage subsequent to the first stage is based on a second set of rules different from the first set of rules, and wherein the flipping threshold is updated in the middle of the single decoding iteration.
 2. The method of claim 1, wherein updating the flipping threshold is based on an index of the decoding iteration, a number of non-zero values in the syndrome, or a number of bits flipped in a column of the parity check matrix in a previous decoding iteration.
 3. The method of claim 1, wherein a set of rules comprises a finite state machine (FSM).
 4. The method of claim 3, wherein the FSM is configured to maximize a throughput of the bit-flipping decoder.
 5. The method of claim 1, wherein flipping the at least one bit comprises flipping multiple bits in the single column.
 6. The method of claim 1, wherein each stage of the plurality of stages corresponds to a predetermined number of clock cycles.
 7. The method of claim 1, wherein an index of the single decoding iteration is less than a maximum number of decoding iterations.
 8. A system for improving convergence of a bit-flipping decoder in a non-volatile memory device, comprising: a processor and a memory including instructions stored thereupon, wherein the instructions upon execution by the processor cause the processor to: receive a noisy codeword, the codeword having been generated based on a parity check matrix of a low-density parity-check (LDPC) code and provided to a communication channel prior to reception by the bit-flipping decoder; and perform a single decoding iteration on the received noisy codeword, the single decoding iteration spanning a plurality of stages, wherein, performing the single decoding iteration includes, for each of the plurality of stages: computing a metric corresponding to a single column of the parity check matrix, flipping at least one bit in the single column upon a determination that the metric exceeds a flipping threshold, computing, subsequent to the flipping, a syndrome as a product of the noisy codeword and the parity check matrix, and updating the flipping threshold upon a determination that the syndrome is not zero, wherein updating the flipping threshold for a first stage of the plurality of stages is based on a first set of rules, and wherein updating the flipping threshold for a second stage subsequent to the first stage is based on a second set of rules different from the first set of rules, and wherein the flipping threshold is updated in the middle of the single decoding iteration.
 9. The system of claim 8, wherein updating the flipping threshold is based on an index of the decoding iteration, a number of non-zero values in the syndrome, or a number of bits flipped in a column of the parity check matrix in a previous decoding iteration.
 10. The system of claim 8, wherein a set of rules comprises a finite state machine (FSM).
 11. The system of claim 10, wherein the FSM is configured to maximize a throughput of the bit-flipping decoder.
 12. The system of claim 8, wherein flipping the at least one bit comprises flipping multiple bits in the single column.
 13. The system of claim 8, wherein each stage of the plurality of stages corresponds to a predetermined number of clock cycles.
 14. The system of claim 8, wherein an index of the single decoding iteration is less than a maximum number of decoding iterations.
 15. A non-transitory computer-readable storage medium having instructions stored thereupon for improving convergence of a bit-flipping decoder in a non-volatile memory device, the instructions being configured to be executed by a processor, and the storage medium comprising: instructions for receiving a noisy codeword, the codeword having been generated based on a parity check matrix of a low-density parity-check (LDPC) code and provided to a communication channel prior to reception by the bit-flipping decoder; and instructions for performing a single decoding iteration on the received noisy codeword, the single decoding iteration spanning a plurality of stages, wherein, the instructions for performing the single decoding iteration include, for each of the plurality of stages: instructions for computing a metric corresponding to a single column of the parity check matrix, instructions for flipping at least one bit in the single column upon a determination that the metric exceeds a flipping threshold, instructions for computing, subsequent to the flipping, a syndrome as a product of the noisy codeword and the parity check matrix, and instructions for updating the flipping threshold upon a determination that the syndrome is not zero, wherein updating the flipping threshold for a first stage of the plurality of stages is based on a first set of rules, and wherein updating the flipping threshold for a second stage subsequent to the first stage is based on a second set of rules different from the first set of rules, and wherein the flipping threshold is updated in the middle of the single decoding iteration.
 16. The storage medium of claim 15, wherein updating the flipping threshold is based on an index of the decoding iteration, a number of non-zero values in the syndrome, or a number of bits flipped in a column of the parity check matrix in a previous decoding iteration.
 17. The storage medium of claim 15, wherein a set of rules comprises a finite state machine (FSM).
 18. The storage medium of claim 17, wherein the FSM is configured to maximize a throughput of the bit-flipping decoder.
 19. The storage medium of claim 15, wherein flipping the at least one bit comprises flipping multiple bits in the single column.
 20. The storage medium of claim 15, wherein each stage of the plurality of stages corresponds to a predetermined number of clock cycles. 